Please use this identifier to cite or link to this item: http://ir.lib.seu.ac.lk/handle/123456789/5435
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dc.contributor.authorMohamed Aslam, Ahamed Lebbe-
dc.date.accessioned2021-04-01T09:31:34Z-
dc.date.available2021-04-01T09:31:34Z-
dc.date.issued2020-06-25-
dc.identifier.citationJournal of Information Systems & Information Technology Vol. 5 No. 1 2020, pp. 68-74.en_US
dc.identifier.issn24780677-
dc.identifier.urihttp://ir.lib.seu.ac.lk/handle/123456789/5435-
dc.description.abstractICT is one of the factors encouraging countries’ tourism demand. The objective of this study is to test the long-run relationship between ICT and tourism demand in Sri Lanka over the period of 1990 -2018. In this study, exploratory data analysis technique, unit root test, bivariate cointegration technique employed as analytical tools. The test result of exploratory data analysis shows that there is a positive relationship between ICT and tourism demand in Sri Lanka. The unit root test results put forward that the variables used in this study are stationary at their 1st difference. Further, the bivariate cointegration test result points out that ICT in Sri Lanka has a long-run relationship with tourism demand. The estimated coefficients of ICT in the short and long-run highlights a beneficial relationship with tourism demand in Sri Lanka. The estimated coefficient of error correction term informs that 0.9% of error will be adjusted every year. The estimated value of Durbin-Watson test statistic indicates that the estimated model is robust. Further, the test result of Granger causality test confirms oneway Granger causal relationship from ICT to tourism demand.en_US
dc.language.isoen_USen_US
dc.publisherFaculty of Management and Commerce South Eastern University of Sri Lankaen_US
dc.subjectICTen_US
dc.subjectTourism Demanden_US
dc.subjectBivariate Cointegration testen_US
dc.subjectGranger causality testen_US
dc.subjectSri Lankaen_US
dc.titleLong-run relationship between ICT and tourism demand in Sri Lanken_US
dc.typeArticleen_US
Appears in Collections:Vol.5 No.1 (2020)

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