Please use this identifier to cite or link to this item: http://ir.lib.seu.ac.lk/handle/123456789/4165
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dc.contributor.authorAnuradha, M. K. Ariyartne-
dc.contributor.authorFaiz, M. M. T. Marikar-
dc.date.accessioned2019-12-17T07:23:30Z-
dc.date.available2019-12-17T07:23:30Z-
dc.date.issued2019-12-18-
dc.identifier.citation8th South Eastern University International Arts Research Symposium -2019. 18th December 2019. South Eastern University of Sri Lanka, Oluvil, Sri Lanka.en_US
dc.identifier.isbn978-955-627-203-1-
dc.identifier.urihttp://ir.lib.seu.ac.lk/handle/123456789/4165-
dc.description.abstractThe present study 'Use of test-teach-test method in Computer Science classes' aims to find out the effect of teach-test-teach method in developing in computer scheme of Bachelor level second year students in the faculty of computing, General Sir John Kotelawala Defence University, Sri Lanka. For this experimental research, the sample population consisted 31 BSc students from a Computer Science college, Suriyawewa Sri Lanka who were selected using purposive non-random sampling procedure. This paper outlines how a Test Teach Test approach could address the noted lack of returns on Sri Lanka’s substantial investment in the field of computer science by promoting student centric method. A pre-test was administered before they were taught the lesson. After teaching method of Test Teach Test, post-test was administered by using the same set as that was used in pre-test. The results of both the tests were compared and determined using simple statistical tool; mean. The findings revealed that the experimental group in Teach Test Teach was found to have performed significantly higher than controlled group.en_US
dc.language.isoen_USen_US
dc.publisherFaculty of Arts and Culture, South Eastern University of Sri Lanka.en_US
dc.subjectComputer science schemeen_US
dc.subjectTeachingen_US
dc.subjectTesting teachingen_US
dc.subjectTestingen_US
dc.titleInnovative teaching technique: the 3T pedagogical model for computer science degree programmeen_US
dc.typeArticleen_US
Appears in Collections:SEUIARS - 2019

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