Please use this identifier to cite or link to this item: http://ir.lib.seu.ac.lk/handle/123456789/7915
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dc.contributor.authorNoor Najaa, A. L.-
dc.contributor.authorJafeen, M. J. M.-
dc.contributor.authorAlthaf, U. L. M.-
dc.date.accessioned2026-04-23T13:07:22Z-
dc.date.available2026-04-23T13:07:22Z-
dc.date.issued2025-10-30-
dc.identifier.citationConference Proceedings of 14th Annual Science Research Session – 2025 on “NEXT-GEN SOLUTIONS: Bridging Science and Sustainability” on October 30th 2025. Faculty of Applied Sciences, South Eastern University of Sri Lanka, Sammanthurai.. pp. 52.en_US
dc.identifier.isbn978-955-627-146-1-
dc.identifier.urihttp://ir.lib.seu.ac.lk/handle/123456789/7915-
dc.description.abstractThe GaAs MOSFET was designed with an aluminium gate, graphite - coated electrodes, and silver nanoparticles embedded in the N-type GaAs channel. The device had a channel length of 1 nm, a width of 10 nm, and an oxide thickness of 0.5 nm. All simulations were performed at room temperature. MATLAB was used to model the device, combining analytical equations with spatially resolved numerical methods to accurately capture its electrical behaviour. Key performance parameters, including threshold voltage, drain current, and leakage current, were extracted. Analysis drain current of the MOSFET considered the influence of oxide thickness, temperature, channel length, and width on overall device performance. The threshold voltage (VTh) of 0.8719 V was obtained and it confirms enhancement mode operation. The simulated GaAs-based MOSFET exhibited a drain current of 6.48 mA cm-1 and a transconductance of 275.76 mS cm-1 at a gate-to-source voltage (VGS) 1.2 V, while the device operating in the saturation region, indicating enhanced carrier mobility and strong gate control. The overall average mobility value of 0.5934 m2 V- 1s-1 indicates high carrier transport efficiency.en_US
dc.language.isoen_USen_US
dc.publisherFaculty of Applied Sciences, South Eastern University of Sri Lanka, Sammanthurai.en_US
dc.subjectAdvanced Device Architecturesen_US
dc.subjectCarrier Mobilityen_US
dc.subjectContact Resistanceen_US
dc.subjectThermal Stabilityen_US
dc.subjectThreshold Voltageen_US
dc.titlePerformance analysis of a silver and graphite-coated gallium arsenide (GaAs) MOSFETen_US
dc.typeArticleen_US
Appears in Collections:14th Annual Science Research Session

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